42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): INVITED TALK: Acquiring Automated and Unattended Serial Section Datasets in the FIB/SEM: What can be done with 2000 image slices?

INVITED TALK: Acquiring Automated and Unattended Serial Section Datasets in the FIB/SEM: What can be done with 2000 image slices?

Thursday, November 10, 2016: 9:15 AM

110AB (Fort Worth Convention Center)

Mr. Michael W. Phaneuf , Fibics Incorporated, Ottawa, ON, Canada

See more of: FIB Sample Preparation
See more of: Technical Program