42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Mr. Michael W. Phaneuf
President
Fibics Incorporated
Ottawa, ON
Canada K1A0G1
Papers:
Patterning in an Imperfect World: Limitations of Focused Ion Beams and their Effects on Advanced Applications at the 14 nm Process Node
INVITED TALK: Acquiring Automated and Unattended Serial Section Datasets in the FIB/SEM: What can be done with 2000 image slices?