42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. Tomas Hrncir
TESCAN Brno s.r.o.
R&D - Physics
Brno Czech Republic 62300
Papers:
How to achieve artefact-free FIB milling on polyimide packages
How to achieve artefact-free FIB milling on polyimide packages
