42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Dr. Jozef Vincenc Obona
TESCAN Brno s.r.o.
R&D - Applications
Brno Czech Republic 62300
Papers:
How to achieve artefact-free FIB milling on polyimide packages
How to achieve artefact-free FIB milling on polyimide packages
