42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Ms. Zhihong You
Texas Instruments
Dallas, TX
USA 75243
Papers:
Failure Analysis Case Study of Inductively Coupled Cross-Chip Signals
Optimization of EeLADA for Circuit Logic Defect Localization Using Defect Simulation