42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Jessica Yang
NVIDIA
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050
Papers:
Nanoscale capacitance-voltage curves for advanced characterization of electrical properties of Si and GaN structures using Scanning Microwave Impedance Microscopy (sMIM)
Visible Light Probing Sample Thinning using Targeted Lapping