42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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Prof. Navid Asadizanjani, PhD

University of Florida
Electrical and Computer Engineering
Gainesville, FL
USA 32611

Papers:

A New Methodology to Protect PCBs from Non-destructive Reverse Engineering
Non-destructive Bond Pull and Ball Shear Failure Analysis Based on Real Structural Properties
A Database for Counterfeit Electronics and Automatic Defect Detection Based on Image processing and Machine Learning

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General Information

November 06 - 10, 2016


Fort Worth, TX