42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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Mr. Richard H. Livengood

Principle Engineer
Intel Corporation
Santa Clara, CA
USA 95054-1549

Papers:

Patterning in an Imperfect World: Limitations of Focused Ion Beams and their Effects on Advanced Applications at the 14 nm Process Node
Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation

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General Information

November 06 - 10, 2016


Fort Worth, TX