Electrical and Yield

Sunday, November 6, 2016: 8:00 AM-2:00 PM
110A (Fort Worth Convention Center)
Electrical and Yield
Session Chairs:  Dr. Jenny Ma, Intel, Chandler, AZ and Mr. Gregory M. Johnson, Physical Failure analyisis, GLOBALFOUNDRIES, Hopewell Junction, NY
8:00 AM
Approaches to Debug Common Yield Limiters
Dr. Szu Huat Goh, GLOBALFOUNDRIES; YH Chan, Global Foundries; Dr. Jeffrey C. Lam, GLOBALFOUNDRIES Singapore Pte Ltd
9:00 AM
The Role of Nanoprobing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs
10:00 AM
Break
10:30 AM
Yield Basics for Failure Analysts
Mr. David Albert, IBM
12:00 PM
Lunch
1:00 PM
Fault Isolation using EBAC and EBIC Technique
Mr. Michél Simon-Najasek, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Mr. Jörg Jatzkowski, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
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