43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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SL Phoa
Advanced Micro Devices - Singapore Pte Ltd
Singapore Singapore 469032
Papers:
STUDENT PAPER: Debugging Signal Corruption in Scan Chain using Phase Laser Voltage Imaging
STUDENT PAPER: Laser Voltage Tracing for Electrical Fault Isolation of Circuits propagating Aperiodic Signals