Mr. Christopher Nemirow, Ph.D

Application Engineer
FEI Company
EFA
Fremont, CA
USA 94538

Papers:

STUDENT PAPER: Debugging Signal Corruption in Scan Chain using Phase Laser Voltage Imaging
STUDENT PAPER: Laser Voltage Tracing for Electrical Fault Isolation of Circuits propagating Aperiodic Signals
The Effects of Using 785nm for Laser Probing