43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

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Dr. Philippe PERDU

Nanyang Technological University
Temasek Laboratories@NTU
Singapore Singapore 637553

Papers:

VLSI for space applications: Single event effect investigation and optical analysis on an integrated laser platform
STUDENT PAPER: Acceptable laser dose of 28 nm FDSOI technology - Correlation of experiment and simulation

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General Information

November 05 - 09, 2017


Pasadena, CA