Mr. Vikash Kumar

Failure Analysis Engineer
Analog Devices
Failure Analysis
Milpitas, CA
USA 95035

Papers:

A novel method/model for fault localization of a subtle open on a large thin-film resistor, using Photon Emission Microscopy (PEM) technique and electric field (F-PE) mechanism
Case study: Lock-in Thermography (LIT) application in failure analysis of a system level DC-DC µmodule regulator