Product Yield, Test & Diagnostics

Tuesday, November 7, 2017: 3:40 PM-4:55 PM
Ballroom C (Pasadena Convention Center)
Mr. Sounil Biswas, Cavium Inc., Dr. Rao Desineni, GLOBALFOUNDRIES and Dr. Manish Sharma, Mentor, A Siemens Business
3:40 PM
ATPG Testing and Diagnosis Implementation for a Fast and Efficient Iterative ATPG Diagnosis and Fault Isolation
Mr. Rommel Estores, ON Semiconductor; Mr. Eric Barbian, ON Semiconductor
4:05 PM
Combining Volume Scan Diagnosis and Dynamic FA for Precise Isolation of Manufacturing Defects
Mr. Amit M. Jakati, GLOBALFOUNDRIES; Mr. Rohan Deshpande, GLOBALFOUNDRIES; Dr. Keith A. Serrels, GLOBALFOUNDRIES; Mr. Gregory Dabney, GLOBALFOUNDRIES; Mr. Anoop Kalarikkal, GLOBALFOUNDRIES; Mr. Pietro Babighian, GLOBALFOUNDRIES
4:30 PM
Targeted Memory Test for Enhanced Diagnostic Fault Localization
Ms. Laura Safran, GLOBALFOUNDRIES; Mr. Christopher Hodge, GLOBALFOUNDRIES; Mr. John Sylvestri, IBM
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