Electrical and Yield I

Sunday, November 5, 2017: 8:00 AM-12:20 PM
Ballroom A (Pasadena Convention Center)
n/a Mr. Gregory M. Johnson, GLOBALFOUNDRIES and Mr. Randal E. Mulder, Silicon Labs
8:00 AM
Failure debugging under product design knowledge constraints
Dr. Szu Huat Goh, GLOBALFOUNDRIES
9:00 AM
The Role of Nanoprobing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs
10:00 AM
Break
10:20 AM
Fault Isolation using EBAC and EBIC Technique
Mr. Michél Simon-Najasek, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
11:20 AM
How to see "Voltage Contrast"
Mr. Li-Lung Lai, Semiconductor Manufacturing International (Shanghai) Corporation
See more of: Tutorial
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