Improved Burn-in Stress Methodology for Stress Uniformity

Wednesday, October 31, 2018

Mr. Jungsuk Ko , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Hoonchang yang , Samsung Electronics, hwaseong, Korea, Republic of (South)

Mr. Hyungchae Jeon , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Gyuyoung Nam , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Youngseok Ryu , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Changyu Park , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Hongsun Hwang , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Dr. Taeyoung Oh , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Jonghoon Kim , Samsung Electronics, Hwaseong, Korea, Republic of (South)

Mr. Seongjin Jang , Samsung Electronics, Hwaseong, Korea, Republic of (South)