Automated Detection of Pin Defects on Counterfeit Microelectronics

Tuesday, October 30, 2018: 10:35 AM
225AB (Phoenix Convention Center)
Ms. Pallabi Ghosh , Indian Institute of Technology, kharagpur, India
Prof. Domenic Forte , University of Florida, Gainesville, FL
Damon L. Woodard , University of Florida, Gainesville, FL
Rajat Subhra Chakraborty , Indian Institute of Technology, kharagpur, India

See more of: Detecting and Preventing Counterfeit Microelectronics
See more of: Technical Program