Detecting and Preventing Counterfeit Microelectronics

Tuesday, October 30, 2018: 10:10 AM-11:50 AM
225AB (Phoenix Convention Center)
Dr. Michael H. Azarian, CALCE, University of Maryland and Mr. Michael D. Woo, Raytheon
10:10 AM
An Overview of Risk-Based EEE Counterfeit Part Detection Based on SAE AS6171
Dr. Michael H. Azarian, CALCE, University of Maryland
10:35 AM
Automated Detection of Pin Defects on Counterfeit Microelectronics
Ms. Pallabi Ghosh, Indian Institute of Technology; Prof. Domenic Forte, University of Florida; Damon L. Woodard, University of Florida; Rajat Subhra Chakraborty, Indian Institute of Technology
11:00 AM
Confocal Laser Scanning Microscopy, a tool for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
Dr. Martine Simard-Normandin, MuAnalysis Inc.
11:25 AM
A New Method to Authenticate Components and PCB Assemblies Using Fingerprint from X-Ray Images
Dr. Bill Cardoso, Creative Electron
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