Predictive Failure Analysis of Solder Joints with Simultaneous High Speed EBSD and EDS

Monday, October 29, 2018: 4:15 PM
225AB (Phoenix Convention Center)
Dr. John Lindsay , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Dr. Pat Trimby , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Dr. Jenny Goulden , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Stewart McCracken , MCS Ltd, Edingburgh, United Kingdom
Richard Andrews , MCS Ltd, Edingburgh, United Kingdom

Summary:

The results presented show the microstructrual analysis of solder joints using EBSD (in combination with EDS). This enables the effective characterisation of the key microstructural parameters of the joints and provides an accurate assessment of the quality of intact bonds. Regions of strain localisation that are not apparent from the Sn and Pb phase distribution can be rapidly identified, providing key insights into the mechanism of bond failure.
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