Correlation of stress release during sample preparation for TEM CBED measurements
Thursday, November 1, 2018: 10:40 AM
225AB (Phoenix Convention Center)
Mr. Jürgen Gluch
,
Fraunhofer IKTS, Dresden, Germany
Mr. Uwe Mühle
,
TU Dresden, Dresden, Germany
Mr. Martin Gall
,
Fraunhofer IKTS, Dresden, Germany
Prof. Ehrenfried Zschech
,
Fraunhofer IKTS, Dresden, Germany
Mr. Chandran Narendraraj
,
TESCAN Brno, Brno, Czech Republic
Mr. Miloš Hrabovský
,
TESCAN Brno, Brno, Czech Republic
Mr. Tomáš Morávek
,
TESCAN Brno, Brno, Czech Republic
