Advances in large-area microelectronic device deprocessing for physical failure analyses and quality control

Wednesday, October 31, 2018: 1:55 PM
226BC (Phoenix Convention Center)
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA
Mr. Michael F. Boccabella , E.A. Fischione Instruments, Inc., Export, PA
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: Sample Preparation and Device Deprocessing II
See more of: Technical Program