Analysis of induced end-of-life failures in SRAM through nanoprobing
Analysis of induced end-of-life failures in SRAM through nanoprobing
Wednesday, October 31, 2018: 1:55 PM
225AB (Phoenix Convention Center)
Summary:
We demonstrate the ability to induce and analyze read and hold margin reductions in 14nm 6T SRAM by using an 8-probe Hyperion II AFP nanoProber to apply elevated bias conditions for 20 minutes to a full cell and measure NBTI/PBTI degradation for the two inverters.
We demonstrate the ability to induce and analyze read and hold margin reductions in 14nm 6T SRAM by using an 8-probe Hyperion II AFP nanoProber to apply elevated bias conditions for 20 minutes to a full cell and measure NBTI/PBTI degradation for the two inverters.