Scan Chain Fault Isolation using Single Event Upsets Induced by a Picosecond 1064nm Laser

Monday, October 29, 2018: 11:10 AM
120A (Phoenix Convention Center)
Dr. Keith A. Serrels , NXP Semiconductors, Austin, TX
Mr. Kristofor Dickson , NXP Semiconductors, Austin, TX
Mr. Dan Bodoh , NXP Semiconductors, Austin, TX
Mr. Kent Erington , NXP Semiconductors, Austin, TX
Mrs. Anusha Weerakoon , NXP Semiconductors, Austin, TX
Mr. Eric Foote , NXP Semiconductors, Austin, TX

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