FIB Based sample preparation for localized SCM and SSRM

Thursday, November 1, 2018: 1:55 PM
226BC (Phoenix Convention Center)
Dr. Frederic Lorut , STMicroelectronics, Crolles, France
Dr. Alexia Valery , STMicroelectronics, Crolles, France
Dr. Nicolas Chevalier , CEA, Grenoble, France
Dr. Denis Mariolle , CEA, Grenoble, France

See more of: FIB Circuit Analysis and Edit
See more of: Technical Program