Localization of Embedded Memories Using EeLADA
Localization of Embedded Memories Using EeLADA
Monday, October 29, 2018: 1:25 PM
225AB (Phoenix Convention Center)
Summary:
To a failure analyst, it is undoubtable that bitmapping is the most efficient method to isolate embedded memory defects. Although it is highly favorable, the process of enabling bitmapping can be time- and resource-consuming. This explains why bitmapping is only available on high volume products where investment is high. EeLADA has been explored previously as a feasible alternative method. However, it is limited to bit-line resolution. This work enhances the EeLADA methodology for bitmapping to achieve bit-cell resolution. Experimental results presented prove the accuracy.
To a failure analyst, it is undoubtable that bitmapping is the most efficient method to isolate embedded memory defects. Although it is highly favorable, the process of enabling bitmapping can be time- and resource-consuming. This explains why bitmapping is only available on high volume products where investment is high. EeLADA has been explored previously as a feasible alternative method. However, it is limited to bit-line resolution. This work enhances the EeLADA methodology for bitmapping to achieve bit-cell resolution. Experimental results presented prove the accuracy.