Fault Isolation

Monday, October 29, 2018: 1:00 PM-2:40 PM
225AB (Phoenix Convention Center)
Mr. Joe Caroselli, AMD and Dr. Keith A. Serrels, NXP Semiconductors
1:00 PM
Beam-based localization using electrons: EBIRCH overview
Mr. Gregory M. Johnson, GLOBALFOUNDRIES; Mr. Christopher D'Aleo, GLOBALFOUNDRIES; Mr. Zaheer Khan, GLOBALFOUNDRIES; Mr. Michael Iwatake, GLOBALFOUNDRIES; Mr. Brian Yates, GLOBALFOUNDRIES; Dr. Ahmad Katnani, GLOBALFOUNDRIES Inc.
1:25 PM
Localization of Embedded Memories Using EeLADA
Dr. SH Goh, GLOBALFOUNDRIES Singapore Pte Ltd
1:50 PM
Use of analog simulation in failure analysis:Application to Emission microscopy and laser Voltage Probing techniques
Mr. Etienne Auvray, ST Microelectronics,; Mr. Paul Armagnat, ST microelectronics; Dr. Luc Saury, ST microelectronics; Dr. Antoine Reverdy, IMS laboratory, University of Bordeaux; Mr. Tommaso Melis, ST microelectronics
2:15 PM
Thermal Exposure Effects of Backside Thinned Flip-Chip Device on Visible Light Probing
Dr. Yuanjing (Jane) Li, NVIDIA; Elia Halteh, NVIDIA; Jonathon Elliott, NVIDIA; Howard Lee Marks, NVIDIA; Mr. Chris Richardson, Allied High Tech Products, Inc.
See more of: Technical Program
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