Mr. Paul Fischione

CEO
E.A. Fischione Instruments, Inc.
Export, PA
USA 15632

Papers:

Low-energy Ar ion milling of FIB TEM specimens from 14 nm and future FinFET technologies
Narrow-Beam Argon Ion Milling of Ex Situ Lift-Out FIB Specimens Mounted on Various Carbon-Supported Grids
Advances in large-area microelectronic device deprocessing for physical failure analyses and quality control