44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018): https://www.asminternational.org/web/istfa-2018/home

44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018

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Dr. Chuan Zhang

Member of Technical Staff
GLOBALFOUNDRIES Inc.
Malta, NY
USA 12020

Papers:

Identification of Defective Fin by E-beam Induced Current in Advanced FinFET Device Failure Analysis
Conductive-AFM for Inline Voltage Contrast Defect Characterization at Advanced Technology Nodes

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General Information

October 28 - November 01, 2018


Phoenix, AZ