Dr. Yuting Wei

GLOBALFOUNDRIES
Malta, NY
USA 12020

Papers:

Identifying the Root Cause of Source-Drain Leakage Caused Soft Fail in Advanced Bulk FinFET Devices
Die-Level Scanning Capacitance Microscopy Fault Isolation on SOI Fin-FET Devices for Advanced Semiconductor Nodes
Yield and Failure Analysis of 14nm On-Chip MIMCAP