Electrical and Yield I

Sunday, October 28, 2018: 8:00 AM-11:20 AM
225AB (Phoenix Convention Center)
Mr. Randal E. Mulder, Silicon Labs and Mr. Gregory M. Johnson, GLOBALFOUNDRIES
8:00 AM
The Role of Nanoprobing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs
9:00 AM
Fault Isolation using Nano-EBAC, EBIC Techniques
Mr. Jörg Jatzkowski, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
10:00 AM
Morning Refreshment Break
10:20 AM
Accelerating Yield Ramp with Failure Debug
Dr. SH Goh, GLOBALFOUNDRIES Singapore Pte Ltd
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