Low Power Devices and Test Structures Case Studies

Thursday, November 1, 2018: 1:30 PM-2:45 PM
225AB (Phoenix Convention Center)
Ms. Rose Ring, LAM Research and Dr. Michael Bruce, Consultant
1:30 PM
Application of Novel Low Current OBIRCH Amplifier and Nanoprobing to identify subtle Leakages in Advanced Node Technologies
Mr. Satish Kodali, GLOBALFOUNDRIES Inc.; Mr. Liangshan Chen, GLOBALFOUNDRIES Inc.; Dr. Yuting wei, GLOBALFOUNDRIES; Ms. Tanya Schaeffer, GLOBALFOUNDRIES Inc.; Mr. Chong Khiam Oh, Globalfoundries Inc. Malta, NY USA
1:55 PM
Yield and Failure Analysis of 14nm On-Chip MIMCAP
Dr. Felix Beaudoin, GLOBALFOUNDRIES; Wei-Hang Chen, GLOBALFOUNDRIES; Mr. Pietro Babighian, GLOBALFOUNDRIES; Dr. Yuting Wei, GLOBALFOUNDRIES; Ernesto Gene de la Garza, GLOBALFOUNDRIES; Lili Cheng, GLOBALFOUNDRIES
2:20 PM
Sub-20nm Device Voltage-Sensitive SRAM Characterization and Failure Analysis
Mr. Seng Nguon (Raymond) Ting, GLOBALFOUNDRIES US; Dr. Felix Beaudoin, GLOBALFOUNDRIES; Mr. Hsien-Ching Lo, GLOBALFOUNDRIES; Mr. Aaron Sinnott, GLOBALFOUNDRIES; Mr. Donald Nedeau, GLOBALFOUNDRIES Inc.
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