FIB Circuit Analysis and Edit - POSTER

Wednesday, October 31, 2018: 2:20 PM-4:20 PM
Dr. Shida Tan, Intel Corporation and Dr. Ken Lagarec, Fibics Incorporated
Automated Diagonal Slice & View Solution for 3D Device Structure Analysis
Dr. Sang Hoon Lee, PhD, Thermo Fisher Scientific; Mr. Jeff Blackwood, Thermo Fisher Scientific; Mr. Stacey Stone, Thermo Fisher Scientific; Michael Schmidt, Thermo Fisher Scientific; Dr. Mark Williamson, PhD, Thermo Fisher Scientific; Woo Jun Kwon, Thermo Fisher Scientific Korea; Sung Jae Lee, Thermo Fisher Scientific Korea
Effective backside circuit edit method for CSP IC
Mr. Youngje Kim, QRT Inc.; Mr. jeonghan yeo, QRT Inc.; Mr. Jaeick choi, QRT Inc.; Mr. Chul Soo Kim, QRT Inc.; Mr. Mummo Jeong, QRT Inc.
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