44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018): https://www.asminternational.org/web/istfa-2018/home

44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018

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Opening Session and EDFAS General Membership Meeting

Monday, October 29, 2018: 8:00 AM-10:00 AM
120A (Phoenix Convention Center)
8:00 AM
IPFA 2018 Best Paper: Characterization of Bandgap Engineering on Operative Transistor Devices by Spectral Photon Emission, Anne Beyreuther, Technische Universität Berlin
8:15 AM
ESREF 2017 Outstanding Paper: Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches, M. Koutsoureli, N. Siannas and G. Papaioannou
See more of: Technical Program
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General Information

October 28 - November 01, 2018


Phoenix, AZ