Nanoprobing and Electrical Characterization II

Wednesday, October 31, 2018: 4:20 PM-5:10 PM
225AB (Phoenix Convention Center)
Mr. John Sanders, DCG Systems and Ms. Sweta Pendyala, Globalfoundries
4:20 PM
Nanoprobing and EBAC for Improving Failure Analysis Success Rates on Sub-14nm Logic and SRAM
Dr. John E. Masnik, Global Foundries; Ms. Noor Jehan Saujauddin, Global Foundries; Kevin Davidson, Global Foundries; Ms. Esther P.Y. Chen, GLOBALFOUNDRIES Inc.
4:45 PM
Time Domain Nanoprobe Analysis of RTS Popcorn Noise in Analog Circuits
Mr. Randal E. Mulder, Silicon Labs
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