FA Processes Case Studies I

Tuesday, October 30, 2018: 3:40 PM-5:20 PM
225AB (Phoenix Convention Center)
Dr. Chuan Zhang, GLOBALFOUNDRIES Inc. and Dr. Erwin Hendarto, Silicon Labs
3:40 PM
Case Study of ESD-induced Pin Leakage Failure Solved using Novel Powered TIVA Technique
Ms. Sneta Mishra, Intel corporation
4:05 PM
Overcoming the challenges of parallel, SRAM Shorts test structures with EBIRCH
Ms. Noor Jehan Saujauddin, Global Foundries; Mr. Lloyd Smith, GLOBALFOUNDRIES; Randy Newkirk, GLOBALFOUNDRIES Malta; Kevin Davidson, Global Foundries; Mr. Gregory M. Johnson, GLOBALFOUNDRIES; Mr. Harvey E. Berman, GLOBALFOUNDRIES; Mr. Zaheer Khan, GLOBALFOUNDRIES; Ms. Esther P.Y. Chen, GLOBALFOUNDRIES Inc.
4:30 PM
A Latent Issue of Via Resistance: Mechanism and Solution
Dr. Wentao Qin, ON Semiconductor; Dr. Scott Donaldson, ON Semiconductor; Dr. Dan Rogers, ON Semiconductor; Dr. Lahcen Boukhanfra, On Semiconductor; Mr. Julien Thiefain, On Semiconductor; Ms. Denise Barrientos, ON Semiconductor; Dr. Gordy Grivna, On Semiconductor; Dr. Jim steinwall, ON Semiconductor; Dr. George Chang, ON Semiconductor; Mr. Jeff Gambino, ON Semiconductor
4:55 PM
Failure Analysis for Inter-level Short in Nanometer Semiconductor Technologies
Dr. Zhigang Song, IBM
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