45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. David Albert

Failure Analysis
IBM
Department EE9
Hopewell Junction, NY
USA 12533

Papers:

Transistor Level Reliability Assessment of Gate Oxide Defects by BTI Stress Nanoprobing
Residual EG Oxide in FinFET Analyses and Its Impact to Yield, Product Performance, and Transistor Reliability
Yield Basics for Failure Analysts

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General Information

November 10 - 14, 2019


Portland, OR