Mixed Mode & High Power Devices Case Studies - POSTERS

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
CASE STUDIES: MIXED MODE & HIGH POWER DEVICES - POSTERS Mr. Stephen Fasolino, Raytheon and Mr. Jeff Gambino, ON Semiconductor
Failure Analysis Approaches for Stacking Fault Defects in FinFET Devices
Mr. Beomjun Kim, Samsung Electronics
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