Packaging and Assembly Level FA

Tuesday, December 8, 2020: 3:25 PM-4:40 PM
Dr. Peng Li, Intel Corporation and Ms. Kannu Wadhwa, ZEISS
3:25 PM
Localization and Characterization of Defects for Advanced Packaging Using Novel EOTPR Probing Approach and Simulation
Dr. Chuan Zhang, NVIDIA Corporation; Dr. Jane Y. Li, NVIDIA Corporation; Mr. John Aguada, NVIDIA Corporation; Mr. Jonathon Elliott, NVIDIA Corporation; Dr. Somayyeh Rahimi, NVIDIA Corporation; Dr. Christian Schmidt, NVIDIA Corporation; Mr. Howard Marks, NVIDIA Corporation; Dr. Thomas White, TeraView Limited; Dr. Jesse Alton, TeraView Limited; Mr. Brett Gibson, TeraView Limited; Mr. Martin Igarashi, TeraView Limited
3:50 PM
Benefits of using a CF4-Free Microwave Induced Plasma (MIP) Spot Etch Process to Remove Underfill and Analyze 2.5D Modules
Mr. Kevin A. Distelhurst, BS/MS Electrical Engineering, GLOBALFOUNDRIES; Mr. Daniel A. Bader, GLOBALFOUNDRIES; Mr. Joe Myers, GLOBALFOUNDRIES; Mr. Ron Russotti, GLOBALFOUNDRIES; Mr. Mark McKinnon, JIACO Instruments; Dr. Jiaqi Tang, JIACO Instruments; Mr. Pradip Sairam Pichumani, Facebook
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