NANOPROBING, ELECTRICAL CHARACTERIZATION: P-N Junction Analysis using Electron Beam Induced Current (EBIC) Technique

Wednesday, November 3, 2021
West Hall 1-2 (Phoenix Convention Center)
Ms. Lori Sarnecki , ON Semiconductor, South Portland, ME
Regina Kuan , ON Semiconductor, South Portland, ME
Mr. Kuang Shien Lee , ON Semiconductor, South Portland, ME

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