47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Technical Program
Monday, November 1, 2021
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8:00 AM-10:00 AM
Opening Session and EDFAS General Membership Meeting
10:00 AM-10:20 AM
Morning Refreshment Break
10:20 AM-12:15 PM
Emerging FA Techniques and Concepts
Session Chair: Dr. William Lo and Dr. Eckhard Langer
12:15 PM-1:30 PM
Lunch
1:30 PM-2:20 PM
Detecting and Preventing Counterfeit Microelectronics
Session Chair: Ms. Pamela C. Fagnani and Mr. Kevin Awai
Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Pai Tangyunyong
2:45 PM-3:00 PM
Afternoon Refreshment Break
3:00 PM-4:15 PM
Die Level Fault Isolation
Session Chair: Mr. Dan Bodoh and Ms. Lesly Endrinal
3:00 PM-4:30 PM
SiP and 3D Devices
Session Chair: Prof. Ingrid De Wolf and Ms. Kannu Wadhwa
4:15 PM-4:40 PM
Case Studies: FA Processes
Session Chair: Dr. Mike Bruce and Mr. Christopher Penley
5:00 PM-6:45 PM
Tools of the Trade Tour
7:00 PM-10:00 PM
Social Event: 810 Billiards & Bowling
Tuesday, November 2, 2021
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8:30 AM-9:30 AM
Keynote Session: Dr. Ravi Mahajan
9:30 AM-10:10 AM
Morning Refreshment Break
10:10 AM-11:50 AM
AI Applications for FA I
Session Chair: Mr. Pascal Gounet and Dr. Joy Liao
Product Yield, Test & Diagnostics I
Session Chair: Mr. Rommel Estores and Mr. Jayant D'Souza
11:50 AM-1:15 PM
Lunch on the Expo Floor
1:15 PM-2:05 PM
AI Applications for FA II
Session Chair: Mr. Pascal Gounet and Dr. Joy Liao
Product Yield, Test & Diagnostics II
Session Chair: Mr. Rommel Estores and Mr. Jayant D'Souza
2:05 PM-2:45 PM
Afternoon Refreshment Break
2:45 PM-5:00 PM
Sample Prep User Group
System on Package User Group
5:00 PM-6:30 PM
Expo Networking Reception
Wednesday, November 3, 2021
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8:00 AM-9:40 AM
Case Studies: Device Analysis
Session Chair: Mr. Stephen Fasolino and Mr. Jeff Gambino
8:00 AM-10:05 AM
Sample Preparation and Device Deprocessing
Session Chair: Dr. Chuan Zhang and Dr. Erwin Hendarto
10:05 AM-10:35 AM
Morning Refreshment Break
10:35 AM-12:05 PM
Panel Discussion: Overcoming the Challenges in System-in-Package Failure Analysis
12:05 PM-1:05 PM
Lunch on the Expo Floor
1:05 PM-3:05 PM
Poster Session
2:15 PM-3:00 PM
Women in FA
Session Chair: Ms. Renee Parente and Mrs. Efrat Moyal
3:05 PM-5:20 PM
Contactless Probing and Nanoprobing User Group
FIB User Group
Thursday, November 4, 2021
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8:00 AM-9:40 AM
Hardware Attacks, Security, and Reverse Engineering
Session Chair: Dr. E.L. Principe and Mr. Kevin Awai
8:50 AM-9:15 AM
Packaging and Assembly
9:15 AM-9:40 AM
Board and System Level FA
Session Chair: Mr. Jason Wheeler and Mr. John Bescup
9:40 AM-9:50 AM
Morning Refreshment Break
9:50 AM-10:15 AM
FIB Circuit Analysis and Edit
Session Chair: Dr. Daminda Dahanayaka and Mr. Antonio Tollis
9:50 AM-11:55 AM
Nanoprobing, Electrical Characterization
Session Chair: David Albert and Mr. John Sanders
12:20 PM-1:20 PM
Lunch
1:20 PM-3:50 PM
FIB Sample Preparation
Session Chair: Dr. Cathy Vartuli and Ms. Rose Ring
Microscopy and Material Characterization
Session Chair: Mr. Ryan Fredrickson and Dr. Lianfeng Fu