PRODUCT YIELD, TEST & DIAGNOSTICS: Quantile Based Statistical Failure Analysis for Wafer Level Test Comparison

Wednesday, November 3, 2021
West Hall 1-2 (Phoenix Convention Center)
Mr. Jeongwon Bae , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Minjoo Kim , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Jongbum Lee , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Myunghoon Oak , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Choongsun Park , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Sunghun Park , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Dr. Sungsoo Yim , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Heeil Hong , Samsung Electronics, Hwaseong City, Korea, Republic of (South)
Mr. Jooyoung Lee , Samsung Electronics, Hwaseong City, Korea, Republic of (South)

See more of: Poster Session
See more of: Technical Program