(V) Automated TEM Workflow for Inline Defect Characterization

Thursday, November 4, 2021: 1:20 PM
104 ABC (Phoenix Convention Center)
Dr. Hyun Woo Shim , Intel Corporation, Hillsboro, OR
Dr. Taehun Lee , Intel Corporation, Hillsboro, OR
Dr. Jonghan Kwon , Intel Corporation, Hillsboro, OR

See more of: FIB Sample Preparation
See more of: Technical Program