(V) DIE LEVEL FAULT ISOLATION: Electro-Optical Probing for Capturing Fast-to-Rise Scan Chain Failures
(V) DIE LEVEL FAULT ISOLATION: Electro-Optical Probing for Capturing Fast-to-Rise Scan Chain Failures
Wednesday, November 3, 2021
West Hall 1-2 (Phoenix Convention Center)
Summary:
Electro Optical Probing was shown in this paper as an effective tool for finding failures in fast-to-rise scan chain analysis. . Instead of relying on destructive methods to verify if the scan cells are failing, it lessens the analysis time by identifying the suspect ROI before PFA.
Electro Optical Probing was shown in this paper as an effective tool for finding failures in fast-to-rise scan chain analysis. . Instead of relying on destructive methods to verify if the scan cells are failing, it lessens the analysis time by identifying the suspect ROI before PFA.