(V) Genetic Algorithm-based Digital Test Optimization Method and its Application to Yield Improvement
(V) Genetic Algorithm-based Digital Test Optimization Method and its Application to Yield Improvement
Tuesday, November 2, 2021: 11:25 AM
105 AB (Phoenix Convention Center)
Summary:
The authors presented a novel way based on machine learning (genetic algorithm) method to optimize timing edges setting in ATE test to enhance yield.
The authors presented a novel way based on machine learning (genetic algorithm) method to optimize timing edges setting in ATE test to enhance yield.