Product Yield, Test & Diagnostics I
Tuesday, November 2, 2021: 10:10 AM-11:50 AM
105 AB (Phoenix Convention Center)
| * Yield and Reliability Enhancement |
| * Metrology and In-line Device Characterization |
| * Diagnostic Testing, Scanning and Debug |
Mr. Rommel Estores, ON Semiconductor and Mr. Jayant D'Souza, Mentor
11:00 AM
(V) Improving Diagnosis Resolution with Population Level Statistical Diagnosis
Dr. Kun Young Chung, Qualcomm Technologies, Inc.;
Mr. Shaun Nicholson, Qualcomm Technologies, Inc.;
Dr. Soumya Mittal, Qualcomm Technologies, Inc.;
Mr. Martin Parley, Qualcomm Technologies, Inc.;
Mr. Gaurav Veda, Siemens Digital Industries Software;
Dr. Manish Sharma, Siemens Digital Industries Software;
Dr. Matthew Knowles, Siemens Digital Industries Software;
Dr. Wu-Tung Cheng, Siemens Digital Industries Software
