SiP AND 3D DEVICES: Accelerate Your 3D X-Ray Failure Analysis by Deep Learning High Resolution Reconstruction

Wednesday, November 3, 2021
West Hall 1-2 (Phoenix Convention Center)
Dr. Allen Gu , Carl Zeiss Microscopy, Dublin, CA
Dr. Andriy Andreyev , Carl Zeiss Microscopy, Dublin, CA
Ms. Masako Terada , Carl Zeiss Microscopy, Dublin, CA
Ms. Bernice Zee , Advanced Micro Devices (AMD), Singapore, Singapore
Mrs. Syahirah MD Zulkifli , Advanced Micro Devices (AMD), Singapore, Singapore
Ms. Yanjing Yang , ZEISS Research Microscopy Solutions, Singapore, Singapore

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