(V) Large area semiconductor device delayering for failure identification and analyses

Wednesday, November 3, 2021: 8:00 AM
105 AB (Phoenix Convention Center)
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA
Dr. Cecile S. Bonifacio , E.A. Fischione Instruments, Inc., Export, PA
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: Sample Preparation and Device Deprocessing
See more of: Technical Program