CASE STUDIES - DEVICE ANALYSIS: Failure Case Studies of Oxide-confined VCSELs
CASE STUDIES - DEVICE ANALYSIS: Failure Case Studies of Oxide-confined VCSELs
Wednesday, November 3, 2021
West Hall 1-2 (Phoenix Convention Center)
Summary:
In this paper, a standard VCSEL FA flow is proposed, and four failure mechanisms and their possible root causes are presented. By this investigation, device developer can know how to prepare the samples, observe the defects, judge the root causes and propose suitable countermeasures.
In this paper, a standard VCSEL FA flow is proposed, and four failure mechanisms and their possible root causes are presented. By this investigation, device developer can know how to prepare the samples, observe the defects, judge the root causes and propose suitable countermeasures.