(V) Pulsing test for defect of resistive word line in dram main cell using WGFMU (Waveform Generator Fast Measurement Unit)

Thursday, November 4, 2021: 11:30 AM

105 AB (Phoenix Convention Center)

Mr. JaeYun LEE , SK Hynix, Icheon-si, Korea, Republic of (South)

Mr. EuiSeok KIM , SK Hynix, Icheon-si, Korea, Republic of (South)

N/A JunYeal LIM , SK Hynix, Icheon-si, Korea, Republic of (South)

N/A SeokHoon OH , SK Hynix, Icheon-si, Korea, Republic of (South)

N/A YoungHa PARK , SK Hynix, Icheon-si, Korea, Republic of (South)

Summary:

We propose a new way to conduct pulsing tests using the arbitrary linear waveform in the nano probe system.