47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021): (V) CASE STUDIES - DEVICE ANALYSIS: SRAM Bitcell Defect Identification Methodology using Electrical Failure Analysis Data

(V) CASE STUDIES - DEVICE ANALYSIS: SRAM Bitcell Defect Identification Methodology using Electrical Failure Analysis Data

Wednesday, November 3, 2021

West Hall 1-2 (Phoenix Convention Center)

Dr. Hyungtae Kim , Samsung Electronics, Hwaseong-si, Korea, Republic of (South)

Mr. Geonho Kim , Samsung Electronics, Hwaseong-si, Korea, Republic of (South)

See more of: Poster Session
See more of: Technical Program